Measuring the 6th Wave

Tektronix Innovation Forum 2017

Crimson Hotel Filinvest City, Manila
Date: October 18, 2017 (Wednesday) 



Venue & Program »    What to Expect »

Discover What's Next In Measurement Technology

The progress of humankind is marked by waves of innovation, periods in which bursts of disruptive inventions trigger rapid growth. 

Join us at our Tektronix Innovation Forum as we explore the measurement challenges and opportunities presented by the 6th wave of technological innovation.

Venue and Program

Date: October 18, 2017 (Wednesday)
Venue: 
Crimson Hotel Filinvest City Manila
Level 8 Monet & Pollock Ball Rooms
Entrata Urban Complex, Filinvest City 1781,
2609 Civic Dr, Alabang, Muntinlupa,
1781 Metro Manila, Philippines

Hotel Location
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Time Description / Topic
8.30am – 9.00am Registration
9.00am – 9.30am Keynote - Measuring the 6th Wave
The progress of humankind is marked by waves of innovation, periods in which bursts of disruptive inventions trigger rapid growth. We’ve seen the waves created by the Industrial Revolution, the Steam Engine, Electricity, Automobiles and information technology. Now, momentum is building as we accelerate towards the 6th wave, with rapid advancements in 5G wireless evolution, Internet of Things, core data network expansion and powering of everything, to drive 50 billion connected devices for intelligent automation by 2020. This keynote speech will address what challenges and market opportunities the 6th wave will bring to us and how Tektronix can help engineers and companies to ride on this 6th wave.
9.30am – 10.30am Topic 1: High Resolution Multiple Channel Flexible Mixed Signal Debug
Since Tektronix invented the first triggered oscilloscope in 1946, there were a few significant breakthroughs in the oscilloscopes history, namely the first portable oscilloscope in 1961, the first storage oscilloscope in 1964, the first oscilloscope with persistence mode in 1978, the first digital storage oscilloscope in 1980, the first Digital Phosphor Oscilloscope (DPO) in 1998, the first Mixed Domain Oscilloscope (MDO) in 2011, the first 6-in-1 oscilloscope in 2014, and the first Asynchronous Time Interleaving (ATI) Oscilloscope of 70GHz bandwidth in 2015. But, what will be the next?

This Seminar will talk about the latest Oscilliscope breakthrough from Tektronix, the MSO 5 Series, with the most Analog and Digital Channels, the Highest Resolution, the biggest Display and with the most fantastic Design-For-Touch Users Experience, you will learn how you can use it to speed up your deubg and trouble-shooting of your complex digital embedded system. particularly for power applications that need multiple channels of high resolutions.
10.30am – 11.00am Tea-Break with Solutions Booth Visit
11.00am - 12.00pm Topic 2: Integrated Cross-Domain Debug Approach to Accelerate your Debug and Validation of Wireless Embedded System
With Wireless Everywhere, design engineers are pressed to integrate wireless modules and functionality into their design. Be it Bluettoth, Wi-FI, Zigbee, HoemRF, P25 or other Radio / Wireless standards, as a design or hardware engineer, you will need to validate if it works properly and trouble-shooting if there are problems. In the past, you may need a spectrum analyzer to view and measure wireless or radio signals and an oscilloscope for its digital and analog signals. However, these 2 instruments doesn't talk and correlate. To allow you to view the both Frequency and Time Domain quickly and easily, in this seminar, we will explain how you can use Tektronix MDO4000C Mixed Domain Oscilloscope to capture both Time Domain and Frequency Domain signals at the same time and correlate them together to get you an instant overview what happened in your circuit, and at the end speeding up your trouble-shooting. In this seminar, you will learn some new tricks how to validate and debug your Wireless / Radio Circuitry miore easily and faster.
12.00pm – 1.30pm Lunch with Solutions Booth Visit 
1.30pm – 2.30pm Topic 3: Solving the IoT Power Consumption Measurement Challenges
The growth of objects connected to the internet is expected to exceed 20 billion devices by 2020 and continue to have double-digit growth rates. Many of these devices will be wearable devices, portable medical devices, and battery-operated industrial sensor/transmitters. For these devices, maximizing battery life is essential. To meet the design requirements for battery life, the designer needs to be able to determine the total power consumption that the device is drawing. The designer needs to measure the load current in all the operating states of the device. That includes the very low currents, such as microamps when the device is in its sleep mode states as well as currents which can be in the amps range when the device is in its active, operating modes. Furthermore the load currents are short bursts that can last for only 10's of microseconds when the device is transmitting data. Thus both high sensitivity and speed are needed to capture all the power the device consumes in all its operating states. In addition, the characteristics of the battery impact the performance of the device, particularly near the end of the battery's life or discharge cycle. One way to account for the characteristics of the battery is to simulate the battery so that testing of the device is performed under the most realistic conditions.

This seminar will: 
  • Review the challenges with capturing total device current drain in all operating states
  • Present current measurement options and provide a superior solution
  • Present the challenges with powering a device with a not, well-behaved constant voltage source, a battery
  • Introduce a source that can simulate a battery over the battery’s discharge cycle and provide efficient, repeatable testing of device performance at any state of the battery
  • Show how to create a model for any type of battery
  • Present methods to assess battery life
2.30pm – 3.00pm Tea-Break with Solutions Booth Visit
3.00pm – 4.00pm Topic 4: Increase Lab Efficiency, Connectivity, Workflow and Automation through Building TekSmartLabTM
At many learning institutions, implementing productive and fully integrated instrument networks in classroom or laboratory are a daunting task. In this seminar, you will learn about the Tektronix TekSmartLabTM , the industry's first network-based lab instrument management solution eliminates cabling hassles, improves overall lab management and learning experience for students, instructors and lab managers. Learn how to turn your teaching to be Smater!
4.00pm – 4.30pm Closing & Lucky Draw


Register for Tektronix Innovation Forum

The Experts / Presenters:

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Ronald Dung

Senior Marketing Manager, ASEAN, Tektronix

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Ai Heong Tan

Time Domain Applications Expert, ASEAN, Tektronix

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Louie Fuensalida

Assistant Application Manager, Philippines, 2M Technologies

What to expect at TIF?

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Live Demo

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Presentation by the Expert

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Games and Lucky Draw