Measuring the 6th Wave

Tektronix Innovation Forum 2017

Penang, Malaysia
Date: May 11, 2017 (Thursday) 



Venue & Program »    What to Expect »

Discover What's Next In Measurement Technology

The progress of humankind is marked by waves of innovation, periods in which bursts of disruptive inventions trigger rapid growth. 

Join us at our Tektronix Innovation Forum as we explore the measurement challenges and opportunities presented by the 6th wave of technological innovation.

Venue and Program

Date: May 11, 2017 (Thursday)
Venue: 
Ballroom 3, LG Level - Main Wing
 
Hotel Equatorial Penang
1 Jalan Bukit Jambul
11900 George Town
Penang, Malaysia

Location Map

Time Description / Topic
8.30am – 9.00am Registration
9.00am – 9.30am Keynote
9.15am – 10.30am Topic 1: Simplifying RF Tests in a Complex IoT Design and Deployment
Whether you are designing IOT devices for wearables, smart energy, industrial applications, transportation, building or home automation, you will have learn about the 4 key IOT design challenges commonly encountered in the RF circuit:
1. Validating and troubleshooting common wireless links including 802.11 a/b/g/j/n/ac, Bluetooth, LoRa, Zigbee, RFID and more
2. Matching the Antenna to circuit for maximum power transfer
3. Checking pre-compliance for major regulatory standards before entering the test chamber
4. Troubleshooting interfering radios on your design
10.30am – 11.00am Tea-Break with Solutions Booth Visit
11.00am - 12.00pm Topic 2: Faster Debug & Validation of 100G/400G Datacenter Interconnects
Validation of 100G (NRZ) & 400G(PAM-4) DataCenter silicon and networking designs: Comprehensive review of current and emerging electrical specifications outlining OIF-CEI 4.0 and IEEE 802.3bs/cd/bm/bj. Review of PAM-4 SNDR and Link Training Analysis as it relates to debug and validation in these technology areas. This will be ideal for design & validation engineers who are looking for ways to improve debug techniques as they work on 100G and 400G Datacenter Networking Technologies.
12.00pm – 1.30pm Lunch with Solutions Booth Visit 
1.30pm – 2.30pm Topic 3: Mastering EMI Pre-Compliance
Did you know that most projects fail EMI/EMC testing the first time? Avoid delays in your schedule and save money by catching compliance problems early. When you perform Pre-compliance testing in your lab you greatly improve the probability of a successful first pass of full EMI compliance testing. Learn common test procedures and the latest test techniques for EMI/EMC pre-compliance testing during this session.
2.30pm – 3.30pm Topic 4: From Internet of Things to Interference of Things
EMI regulations are in place throughout the world to provide improved reliability and safety for users of electrical and electronic equipment. Compliance testing is exhaustive and time consuming, and a failure in EMI at this stage of product development can cause expensive re-design and product introduction delays. In order to minimize the cost and delay, this session discusses what are the common sources of failure and useful tools for troubleshooting problems that you may uncover. Lastly we will also go through some of the commonly used EMI solution.
3.30pm – 4.00pm Tea-Break with Solutions Booth Visit
4.00pm – 5.00pm Topic 5: A Complete Solution for All Your Power Electronic Testing Requirements
The need for increased power efficiency is changing the way electronic products are designed, not just with respect to signal and power levels, but also in the complexity of how they are managed and controlled. Design and testing of everyday electronic systems such as AC-DC power supplies, power converters and inverters, LED drivers, and mobile products follow a well-defined path from picking out the right components to verifying compliance of the final assemblies. Each of these stages are affected by the end requirement of efficiency, as well as the need for high accuracy test and debug strategies.
Tektronix & Keithley solutions are crucial for each stage of development, and make it possible for these products to get to market more quickly.
Explore industry leading power testing solutions from Tektronix and Keithley for testing AC-DC, DC-AC and DC-DC power converters. Measure power parameters accurately from mW to MW spanning from battery powered portable devices to high power converters and inverters.
Learn how to characterize discrete components, debug analog and digital circuits, test switching, conduction and magnetic losses, measure high common mode isolated signals, test overall system efficiency, measure AC/DC power consumption at full load and no load and learn about compliance standards and pre compliance testing.
5.00pm – 5.30pm Closing & Lucky Draw

Register for Tektronix Innovation Forum

The Experts / Presenters:

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Xiao Li

Applications Engineer for Source & Analyzer Product Line

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Pavel Zivny

High Speed Serial Data Domain Expert

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Josh Brown

Applications Engineer

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Wei Xiang Tan

Regional Applications Engineer

What to expect at TIF?

Live Demo

Live Demo

Presentation

Presentation by the Expert

Lucky Draw

Games and Lucky Draw